ligitek electronics co.,ltd. property of ligitek only dual color led lamps LESBKS2093 data sheet - 2006 a 11 - may. doc. no : qw0905- rev. : date : LESBKS2093
e 4.0 sbks 5.2 6.7 0.5 4.2 23 1 1 2 3 2.0min 2.54typ 1.anode blue 2.common cathode 3.anode orange 18.0min 1.5 max 0.5 typ 2.0min 2.54typ 3.0 1/5 page ligitek electronics co.,ltd. property of ligitek only part no. package dimensions LESBKS2093 note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation
* static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. typ. 3.5 ---- 50 electrostatic discharge( * ) esd --- v 500 2/5 sbk - s page unit e symbol parameter ligitek electronics co.,ltd. property of ligitek only ratings absolute maximum ratings at ta=25 10 120 100 a mw ma i fp ir pd t opr tstg tsol -20 ~ +80 max 260 for 5 sec max (2mm from body) -30 ~ +100 viewing angle 2 1/2 (deg) 30 30 typ. min. luminous intensity @20ma(mcd) min.max. forward voltage @20ma(v) 350 110 160 50 ---- 1.7 4.2 2.6 dominant wave length dnm lens --- 475 emitted material blue ingan/sic water clear color 26 spectral halfwidth nm operating temperature LESBKS2093 note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. typical electrical & optical characteristics (ta=25 ) part no soldering temperature storage temperature reverse current @5v peak forward current duty 1/10@10khz power dissipation 30 ma forward current i f part no. LESBKS2093 100 120 30 peak wave length pnm 635 orange gaasp/gap 45 ---
1.0 r e l a t i v e i n t e n s i t y @ 2 0 m a 0.0 0.5 wavelength (nm) 550600650 ambient temperature( ) fig.5 relative intensity vs. wavelength fig.3 forward voltage vs. temperature f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 -20 -40 0.8 1.0 0.9 1.1 1.2 0.5 r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 -20 ambient temperature( ) 80 60 40 20 0-40 100 0.0 80 60 02040100 fig.4 relative intensity vs. temperature 2.5 1.5 1.0 2.0 3.0 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve 100 f o r w a r d c u r r e n t ( m a ) 0.1 1.0 10 1.0 1000 e chip r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a 0.5 forward voltage(v) 2.03.04.05.01.0 0.0 1.5 1.0 2.0 2.5 forward current(ma) 101001000 fig.2 relative intensity vs. forward current 3.0 ligitek electronics co.,ltd. property of ligitek only 700750 3/5 page part no. LESBKS2093
4/5 page ligitek electronics co.,ltd. property of ligitek only 1.25 1.5 fig.2 relative intensity vs. forward current 20 101525 30 0.5 0.75 0.25 0 forward voltage(v) 5 0 3 45 forward current(ma) r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a 1.0 sbk-s chip 20 25 30 15 10 5 0 1 f o r w a r d c u r r e n t ( m a ) typical electro-optical characteristics curve fig.1 forward current vs. forward voltage 2 1.0 0.5 fig.4 relative intensity vs. wavelength wavelength (nm) 75 50100 r e l a t i v e i n t e n s i t y @ 2 0 m a 580 380 0 480 480 430 530 630 680 30 40 20 10 0 f o r w a r d c u r r e n t @ 2 0 m a 0 fig.3 forward current vs. temperature ambient temperature( ) 25 part no. LESBKS2093
5/5 page reference standard description test condition test item reliability test: ligitek electronics co.,ltd. property of ligitek only mil-std-883:1008 jis c 7021: b-10 mil-std-202:103b jis c 7021: b-11 jis c 7021: b-12 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) the purpose of this test is the resistance of the device under tropical for hours. the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles 1.t.sol=230 5 2.dwell time=5 1sec 1.t.sol=260 5 2.dwell time= 10 1sec. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. high temperature storage test high temperature high humidity test low temperature storage test thermal shock test solderability test solder resistance test this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. operating life test 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 part no. LESBKS2093
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